Metrology, Testing and Measurement
Watlow utilizes advanced metrology tools and state-of-the-art measurement methods to characterize and validate our products. These tools include equipment such as CMM, ICP-MS, X-ray, interferometer, acoustic imaging, TGA, rheometer, infrared thermography, helium leak detection, instrumented T/C wafers and vacuum and RF plasma chambers. Watlow has extensive reliability engineering capabilities and can comply with numerous industry standards such as SEMI, ASTM, NIST and UL®. We perform accelerated life testing and generate reliability predictions, conduct failure analysis to determine root cause and deploy risk mitigation tools within product and process development programs.
Contact your Watlow semiconductor representative for more information.